Wee, Andrew T. S. | Tang, Chi Sin. | Yin, Xinmao

Introduction to Spectroscopic Ellipsometry of Thin Film Materials : Instrumentation, Data Analysis, and Applications

E-book EPUB

Consultabile solo con Torrossa Reader (scopri come)

Wee, Andrew T. S. | Tang, Chi Sin. | Yin, Xinmao

Introduction to Spectroscopic Ellipsometry of Thin Film Materials : Instrumentation, Data Analysis, and Applications

438142 characters.

Informazioni
ISBN: 9783527833955

Permalink: http://digital.casalini.it/9783527833955
MATERIE
- Ingegneria e attività affini
- Engineering, Civil Engineering

EUR 93,99

Iva esclusa

EPUB

Opzioni d'uso

Download

Copia/Incolla

Stampa