Wee, Andrew T. S. | Tang, Chi Sin. | Yin, Xinmao

Introduction to Spectroscopic Ellipsometry of Thin Film Materials : Instrumentation, Data Analysis, and Applications

2022 - John Wiley et Sons Ltd.

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Wee, Andrew T. S. | Tang, Chi Sin. | Yin, Xinmao

Introduction to Spectroscopic Ellipsometry of Thin Film Materials : Instrumentation, Data Analysis, and Applications

2022 - John Wiley et Sons Ltd.

438142 characters.

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ISBN: 9783527833955

Permalink: http://digital.casalini.it/9783527833955
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- Engineering, Civil Engineering

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