Conductive Atomic Force Microscopy : Applications in Nanomaterials

2017 - John Wiley et Sons Ltd.

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Conductive Atomic Force Microscopy : Applications in Nanomaterials

2017 - John Wiley et Sons Ltd.

955973 characters.

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ISBN: 9783527699797

Permalink: http://digital.casalini.it/9783527699797
MATERIE
- Chimica e scienze connesse
- Chemistry

EUR 146,86

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