Dahoo, Pierre-Richard | El Hami, Abdelkhalak | Pougnet, Philippe

Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering and RBDO Method

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Dahoo, Pierre-Richard | El Hami, Abdelkhalak | Pougnet, Philippe

Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering and RBDO Method

248760 characters.

Informazioni
ISBN: 9781119818977

Permalink: http://digital.casalini.it/9781119818977
MATERIE
- Matematica. Analisi
- Mathematics

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