2011 - Wiley-VCH
ID: 6294096
E-book EPUB
Pris en charge par Torrossa Reader (voir détails)
Mechanical Stress on the Nanoscale : Simulation, Material Systems and Characterization Techniques
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics. [Publisher's Text]
16983 characters.
-
Informations
ISBN: 9783527639557
TVA exclue
EPUB E-book
Voir les conditions d’utilisation
