Servin, Manuel | Padilla, Moises | Quiroga, J. Antonio

Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications

2014 - John Wiley et Sons Ltd.

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Servin, Manuel | Padilla, Moises | Quiroga, J. Antonio

Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications

2014 - John Wiley et Sons Ltd.

522462 characters.

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ISBN: 9783527681105

Permalink: http://digital.casalini.it/9783527681105
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- Applied physics
- Mechanical Engineering and Machinery

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