Dahoo, Pierre-Richard | El Hami, Abdelkhalak | Pougnet, Philippe

Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties

2021 - John Wiley et Sons Ltd.

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Dahoo, Pierre-Richard | El Hami, Abdelkhalak | Pougnet, Philippe

Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties

2021 - John Wiley et Sons Ltd.

315195 characters.

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ISBN: 9781119808145

Permalink: http://digital.casalini.it/9781119808145
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- Engineering and allied operations
- Engineering, Civil Engineering

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