E-book
Digital Version
Download | Copy/paste | Printing
Gupta, D. | Siegel, R.W. | Jain, H.

Atomic Migration and Defects in Materials

1991 - Trans Tech Publications

254 p.

  • The book covers various aspects of of diffusion: its fundamental nature, methodology of experimental and analytical techniques, and implications in modern technology. [Publisher's text].
  • Special access authorizations may apply; please contact us for further information.